Publications

Method of fabricating least defective non-planar bipolar heterostructure transistors

Abstract

A method for fabricating low defective non-planar bipolar heterostructure transistors includes a steps of providing a substrate that is coated with a first dielectric layer when the substrate is not composed of a dielectric material. A layer of a first semiconductor material is formed by template liquid phase (TLP) crystal growth wherein a second dielectric layer is disposed over the first semiconductor material. A trench is patterned into the second dielectric layer. An intermediate heterostructure is formed by epitaxially growing second semiconductor material in the trench to form a fin structure therein. Various power transistor structures can be formed from the intermediate heterostructure.

Date
September 12, 2024
Authors
AP Jacob, RR Kapadia
Inventors
Ajey Poovannummoottil Jacob, Rehan Rashid Kapadia
Patent_office
US
Application_number
18579330