Publications

FinFET device including a uniform silicon alloy fin

Abstract

(57) ABSTRACT A method includes forming at least one fin on a semiconduc tor substrate. A silicon alloy material is formed on the finand on exposed Surface portions of the Substrate. A thermal pro cess is performed to define a silicon alloy fin from the silicon alloy material and the fin and to define silicon alloy surface portions from the silicon alloy material and the exposed Sur face portions of the Substrate. A semiconductor device includes a substrate, a fin defined on the substrate, the fin comprising a silicon alloy and having a substantially vertical sidewall, and silicon alloy surface portions on the Substrate adjacent the fin.

Date
August 2, 2016
Authors
AP Jacob, JA Fronheiser, MK Akarvardar, S Bentley
Inventors
Ajey Poovannummoottil Jacob, Jody A Fronheiser, Murat Kerem Akarvardar, Steven Bentley
Patent_office
US
Patent_number
9406803
Application_number
14676239